Stereometric analysis of Ta2O5 thin lms

The purpose of this work is the study of the correlation between the thickness of tantalum pentoxide thin lms and their three-dimensional (3D) micromorphology.The samples were prepared on silicon substrates by electron beam evaporation. The differences in surface structure of the processed and references samples were investigated. Compositional studies were performed by energy-dispersiveX-rayspectroscopy. Stereometric analysis was carried out on the basis of atomic force microscopy(AFM) data, for antalum pentoxide samples with 20nm, 40nm,60nm, 80nm and 100nm thicknesses. These methods are frequently used in describing experimental data of surface nanomorphology of Ta2O5. The results can be used to validate theoretical models for prediction or correlation of nanotexture surface parameters.

Keywords

atomic force microscopy; stereometric analysis; Ta2O5, topograph

Citation

MATERIALS SCIENCE-POLAND. 2020, vol. 1, issue 1, p. 1-10.
https://content.sciendo.com/view/journals/msp/ahead-of-print/article-10.2478-msp-2019-0083.xml

Document type

Peer-reviewed

Document version

Published version

Language of document

en

Document licence

Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International
http://creativecommons.org/licenses/by-nc-nd/4.0/