Field Electron Emission Performance And Orthodoxy Test Of Tungsten Emitters With And Without Thin Tungsten Trioxide Barrier

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Date
2020
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Mark
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Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract
This initial study aims to explore the topic of thin barrier layers for single tip cold field emitters. The experiment and measurements have been conducted in ultra-high vacuum field electron microscope. Additionally, micrographs of the emitter were obtained using scanning electron microscope. The performance of the emitter was evaluated using orthodoxy test and Murphy-Good plots, which can give more complete picture of emitter changes during field emission.
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Proceedings II of the 26st Conference STUDENT EEICT 2020: Selected Papers. s. 192-196. ISBN 978-80-214-5868-0
https://conf.feec.vutbr.cz/eeict/EEICT2020
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Peer-reviewed
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en
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© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
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