Field Electron Emission Performance And Orthodoxy Test Of Tungsten Emitters With And Without Thin Tungsten Trioxide Barrier

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but.event.date23.04.2020cs
but.event.titleStudent EEICT 2020cs
dc.contributor.authorBurda, Daniel
dc.date.accessioned2021-07-15T13:12:39Z
dc.date.available2021-07-15T13:12:39Z
dc.date.issued2020cs
dc.description.abstractThis initial study aims to explore the topic of thin barrier layers for single tip cold field emitters. The experiment and measurements have been conducted in ultra-high vacuum field electron microscope. Additionally, micrographs of the emitter were obtained using scanning electron microscope. The performance of the emitter was evaluated using orthodoxy test and Murphy-Good plots, which can give more complete picture of emitter changes during field emission.en
dc.formattextcs
dc.format.extent192-196cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings II of the 26st Conference STUDENT EEICT 2020: Selected Papers. s. 192-196. ISBN 978-80-214-5868-0cs
dc.identifier.isbn978-80-214-5868-0
dc.identifier.urihttp://hdl.handle.net/11012/200651
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings II of the 26st Conference STUDENT EEICT 2020: Selected papersen
dc.relation.urihttps://conf.feec.vutbr.cz/eeict/EEICT2020cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjectCold field emissionen
dc.subjectsingle tip field emittersen
dc.subjecttungsten tipen
dc.subjectself-heating of electron emitteren
dc.subjecttungsten trioxideen
dc.subjectdielectric barrieren
dc.subjectMurphy-Good ploten
dc.titleField Electron Emission Performance And Orthodoxy Test Of Tungsten Emitters With And Without Thin Tungsten Trioxide Barrieren
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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