Now showing items 1-2 of 2

  • Lidt Tests On Optical Elements Under Special Conditions 

    Oulehla, Jindřich (Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií, 2019)
    This contribution presents a technology for the design, deposition and testing of thin film coatings on optical elements designed to operate in high power pulsed laser systems. I have designed and built a test station which ...
  • Stereometric analysis of Ta2O5 thin lms 

    Sobola, Dinara; Kaspar, Pavel; Oulehla, Jindřich; Papež, Nikola (De Gruyter, 2020-01-27)
    The purpose of this work is the study of the correlation between the thickness of tantalum pentoxide thin lms and their three-dimensional (3D) micromorphology.The samples were prepared on silicon substrates by electron ...