An Automated ESD Model Characterization Method
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Novel automated simulator-independent ESD model characterization method based on Differential evolution and Nelder-Mead Simplex algorithms is presented in this paper. It offers an alternative for time and human-resources demanding manual characterization that is still widely used. The paper also presents stable models of the four most often used snapback-based protection devices in CMOS technologies, i.e., NMOST and three variants of silicon-controlled rectifier structure. These models were used for evaluation of the proposed method and the results are included and discussed.
KeywordsESD, automated model calibration, differential evolution, Nelder-Mead simplex, I-V characteristic
Document typePeer reviewed
Document versionFinal PDF
SourceRadioengineering. 2018 vol. 27, č. 3, s. 784-795. ISSN 1210-2512
- 2018/3