Reduction Of Metal Artefacts In Ct Data With Submicron Resolution Using Dual-Target Ct
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The article deals with the possibility of the metal artefact reduction in computed tomography (CT) data with submicron resolution using dual-target CT. The sample is scanned twice at different acquisition parameters, at two different energy spectra. Dual-energy data are then used for easier localisation and segmentation of metal areas and the final combination of low and high-density materials. The final images are compared with the projection-based metal artefact reduction (MAR) algorithm and the commercial program VGStudio MAX 3.1. The results show good functionality of the proposed method and potential for further development.
KeywordsX-ray computed tomography, Nanotomography, Submicron resolution, CT images artefacts, Reduction of metal artefacts, Dual-Target CT
Document typePeer reviewed
Document versionFinal PDF
SourceProceedings of the 25st Conference STUDENT EEICT 2019. s. 394-397. ISBN 978-80-214-5735-5
- Student EEICT 2019