Browsing Vývoj metod analýzy a měření by Title

Now showing items 1-9 of 9

  • Amine modification of calcium phosphate by low-pressure plasma for bone regeneration 

    Kodama, Joe; Harumningtyas, Anjar Anggraini; Ito, Tomoko; Michlíček, Miroslav; Sugimoto, Satoshi; Kita, Hidekazu; Chijimatsu, Ryota; Ukon, Yuichiro; Kushioka, Junichi; Okada, Rintaro; Kamatani, Takashi; Hashimoto, Kunihiko; Tateiwa, Daisuke; Tsukazaki, Hiroyuki; Nakagawa, Shinichi; Takenaka, Shota; Makino, Takahiro; Sakai, Yusuke; Nečas, David; Zajíčková, Lenka; Hamaguchi, Satoshi; Kaito, Takashi (Nature Portfolio, 2021-09-01)
    Regeneration of large bone defects caused by trauma or tumor resection remains one of the biggest challenges in orthopedic surgery. Because of the limited availability of autograft material, the use of artificial bone is ...

  • Cell type specific adhesion to surfaces functionalised by amine plasma polymers 

    Černochová, Petra; Blahová, Lucie; Medalová, Jiřina; Nečas, David; Michlíček, Miroslav; Kaushik, Preeti; Přibyl, Jan; Bartošíková, Jana; Manakhov, Anton; Bačáková, Lucie; Zajíčková, Lenka (Springer Nature, 2020-06-09)
    Our previously-obtained impressive results of highly increased C2C12 mouse myoblast adhesion to amine plasma polymers (PPs) motivated current detailed studies of cell resistance to trypsinization, cell proliferation, ...

  • Deposition penetration depth and sticking probability in plasma polymerization of cyclopropylamine 

    Michlíček, Miroslav; Blahová, Lucie; Dvořáková, Eva; Nečas, David; Zajíčková, Lenka (Elsevier, 2021-02-02)
    Understanding the role of substrate geometry is vital for a successful optimization of low-pressure plasma polymerization on non-planar substrates used in bioapplications, such as porous materials or well plates. We ...

  • GSvit - An open source FDTD solver for realistic nanoscale optics simulations 

    Klapetek, Petr; Grolich, Petr; Nezval, David; Valtr, Miroslav; Šlesinger, Radek; Nečas, David (Elsevier, 2021-08-01)
    Surface and volume imperfections can significantly affect the performance of nanoscale or microscale devices used in photonics, optoelectronics or scientific instrumentation. In this article we present an open source ...

  • How levelling and scan line corrections ruin roughness measurement and how to prevent it 

    Nečas, David; Valtr, Miroslav; Klapetek, Petr (Springer Nature, 2020-09-17)
    Surface roughness plays an important role in various fields of nanoscience and nanotechnology. However, the present practices in roughness measurements, typically based on some Atomic Force Microscopy measurements for ...

  • Interplay between multipole expansion of exchange interaction and Coulomb correlation of exciton in colloidal II-VI quantum dots 

    Klenovský, Petr; Valdhans, Jakub; Krejčí, Lucie; Valtr, Miroslav; Klapetek, Petr; Fedotova, Olga (IOP Publishing Ltd, 2022-03-01)
    We study the effect of Coulomb correlation on the emission properties of the ground state exciton in zincblende CdSe/ZnS core-shell and in wurtzite ZnO quantum dots (QDs). We validate our theory model by comparing results ...

  • Multiple-fibre interferometry setup for probe sample interaction measurements in atomic force microscopy 

    Klapetek, Petr; Yacoot, Andrew; Hortvík, Václav; Duchoň, Václav; Dongmo, Herve; Řeřucha, Šimon; Valtr, Miroslav; Nečas, David (IOP Publishing, 2020-09-01)
    Atomic force microscopy (AFM) often relies on the assumption that cantilever bending can be described by simple beam theory and that the displacement of the tip can be evaluated from the cantilever angle. Some more advanced ...

  • Optical characterization of inhomogeneous thin films with randomly rough boundaries 

    Vohánka, Jíří; Ohlídal, Ivan; Buršíková, Vilma; Klapetek, Petr; Kaur, Nupinder Jeet (Optica Publishing Group, 2022-01-17)
    An inhomogeneous polymer-like thin film was deposited by the plasma enhanced chemical vapor deposition onto silicon single-crystal substrate whose surface was roughened by anodic oxidation. The inhomogeneous thin film with ...

  • Synthetic Data in Quantitative Scanning Probe Microscopy 

    Nečas, David; Klapetek, Petr (MDPI, 2021-06-01)
    Synthetic data are of increasing importance in nanometrology. They can be used for development of data processing methods, analysis of uncertainties and estimation of various measurement artefacts. In this paper we review ...