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  • Determination accuracy of analysis refractory materials by x-ray fluorescence 

    Janča, Martin; Šiler, Pavel; Opravil, Tomáš; Kotrla, Jan (IOP Publishing, 2018-07-12)
    This work was focused on the finding of the right way how to analyze refractory materials by X-ray fluorescence. This method can provide accurate results which can be easily repeated, what is the reason why this method is ...