Browsing Publikační činnost pracovníků VUT v Brně by Subject "back-scattered electrons"
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Nanoscale Estimation of Coating Thickness on Substrates via Standardless BSE Detector Calibration
(MDPI, 2020-02-15)The thickness of electron transparent samples can be measured in an electron microscope using several imaging techniques like electron energy loss spectroscopy (EELS) or quantitative scanning transmission electron microscopy ...