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  • X-ray induced electrostatic graphene doping via defect charging in gate dielectric 

    Procházka, Pavel; Mareček, David; Lišková, Zuzana; Čechal, Jan; Šikola, Tomáš (NPG, 2017-04-03)
    Graphene field effect transistors are becoming an integral part of advanced devices. Hence, the advanced strategies for both characterization and tuning of graphene properties are required. Here we show that the X-ray ...