Method For Extending The Field Of View For X-Ray Computed Tomography With Submicron Resolution
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Computed tomography allows for nondestructive evaluation of samples. It is commonly used for many industrial and scientific applications. Some devices are capable of submicron resolutions, but this often comes at the cost of a limited field of view. Techniques that extend the field of view can greatly enhance the versatility of these scanners. One such technique is presented here. It is implemented on the Rigaku Nano3DX, almost doubling its lateral field of view. The method utilizes a standard reconstruction algorithm, and yields faithful reconstructions of scanned samples without the need for a larger detector.
Document typePeer reviewed
Document versionFinal PDF
SourceProceedings II of the 26st Conference STUDENT EEICT 2020: Selected Papers. s. 64-67. ISBN 978-80-214-5868-0
- Student EEICT 2020