Field Electron Emission Performance And Orthodoxy Test Of Tungsten Emitters With And Without Thin Tungsten Trioxide Barrier
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This initial study aims to explore the topic of thin barrier layers for single tip cold field emitters. The experiment and measurements have been conducted in ultra-high vacuum field electron microscope. Additionally, micrographs of the emitter were obtained using scanning electron microscope. The performance of the emitter was evaluated using orthodoxy test and Murphy-Good plots, which can give more complete picture of emitter changes during field emission.
KeywordsCold field emission, single tip field emitters, tungsten tip, self-heating of electron emitter, tungsten trioxide, dielectric barrier, Murphy-Good plot
Document typePeer reviewed
Document versionFinal PDF
SourceProceedings II of the 26st Conference STUDENT EEICT 2020: Selected Papers. s. 192-196. ISBN 978-80-214-5868-0
- Student EEICT 2020