Now showing items 1-5 of 5

  • Complementary SEM-AFM of Swelling Bi-Fe-O Film on HOPG Substrate 

    Sobola, Dinara; Ramazanov, Shihgasan; Konečný, Martin; Orudzhev, Farid; Kaspar, Pavel; Papež, Nikola; Knápek, Alexandr; Potoček, Michal (MDPI, 2020-05-23)
    The objective of this work is to study the delamination of bismuth ferrite prepared by atomic layer deposition on highly oriented pyrolytic graphite (HOPG) substrate. The samples’ structures and compositions are provided ...
  • Fractal Analysis of the 3-D surface Topography of GaAs Solar Cells 

    Talu, Stefan; Papež, Nikola; Sobola, Dinara; Tofel, Pavel (DEStech Publications, Inc., 2018-02-11)
    This article is devoted to study of Atomic Force Microscopy (AFM) images of solar cells based on gallium arsenide (GaAs). Mathematical processing of data involves obtaining additional information about topography. The ...
  • Investigation of structure of AlN thin films using Fourier-transform infrared spectroscopy 

    Dallaev, Rashid; Papež, Nikola; Sobola, Dinara; Ramazanov, Shihgasan; Sedlák, Petr (Elsevier, 2020-02-19)
    This study focuses on structural imperfections caused by hydrogen impurities in AlN thin films obtained using atomic layer deposition method (ALD). Currently, there is a severe lack of studies regarding the presence of ...
  • Microstructural investigation of defects in photovoltaic cells by the electron beam-induced current method 

    Papež, Nikola; Dallaev, Rashid; Sobola, Dinara; Macků, Robert; Škarvada, Pavel (Elsevier, 2020-02-19)
    This work aims to clarify the application of electron beam-induced current (EBIC) method for the morphological analysis and detection of local defects and impurities in semiconductor structures such as solar cells. One of ...
  • Stereometric analysis of Ta2O5 thin lms 

    Sobola, Dinara; Kaspar, Pavel; Oulehla, Jindřich; Papež, Nikola (De Gruyter, 2020-01-27)
    The purpose of this work is the study of the correlation between the thickness of tantalum pentoxide thin lms and their three-dimensional (3D) micromorphology.The samples were prepared on silicon substrates by electron ...