Browsing Fakulta elektrotechniky a komunikačních technologií by Author "Tománek, Pavel"

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Microscopic optoelectronic defectoscopy of solar cells

Škarvada, Pavel; Tománek, Pavel; Koktavý, Pavel; Sobola, Dinara (EDP Sciences, 2013-05-03)

Scanning probe microscopes are powerful tool for micro- or nanoscale diagnostics of defects in crystalline silicon solar cells. Solar cell is a large p-n junction semiconductor device. Its quality is strongly damaged by ...
Scanning proximal microscopy study of the thin layers of silicon carbide aluminum nitride solid solution manufactured by fast sublimation epitaxy

Sobola, Dinara; Korostylev, Evgenij; Bilalov, Bilal; Tománek, Pavel (EDP Sciences, 2013-05-03)

The objective of the study is a growth of SiC/(SiC)1-x(AlN)x structures by fast sublimation epitaxy of the polycrystalline source of (SiC)1-x(AlN)x and their characterisation by proximal scanning electron microscopy and ...