Modelling and Measuring Dielectric Constants for Very Thin Materials Using a Coaxial Probe

This paper is focused on the non-destructive measurement of the dielectric constants (relative permittivities) of thin dielectric material (0.1 mm – 0.5 mm) using an open-ended coaxial probe with an outer diameter of 4.1 mm. Normalized de-embedding and network error calibration procedures were applied to the coaxial probe. The measured reflection coefficients for the thin samples were taken with a vector network analyzer up to 7 GHz, and the calibrated reflection coefficients were converted to relative dielectric constant using an empirical reflection-coefficient model. The empirical model was created using the regression method and expressed as a polynomial model, and the coefficients of model were obtained by fitting with the data using the Finite Element Method (FEM).

Keywords

Relative effective permittivity, one-port calibration, measured reflection coefficient, open-ended coaxial probe, thin dielectric substrate

Citation

Radioengineering. 2014, vol. 23, č. 4, s. 1016-1025. ISSN 1210-2512
http://www.radioeng.cz/fulltexts/2014/14_04_1016_1025.pdf

Document type

Peer-reviewed

Document version

Published version

Language of document

en

Document licence

Creative Commons Attribution 3.0 Unported License
http://creativecommons.org/licenses/by/3.0/