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dc.contributor.authorSouliotis, George
dc.contributor.authorLaoudias, Costas
dc.contributor.authorTerzopoulos, Nikolaos
dc.date.accessioned2014-12-16T09:35:39Z
dc.date.available2014-12-16T09:35:39Z
dc.date.issued2014-12cs
dc.identifier.citationRadioengineering. 2014, vol. 23, č. 4, s. 1121-1129. ISSN 1210-2512cs
dc.identifier.issn1210-2512
dc.identifier.urihttp://hdl.handle.net/11012/36570
dc.description.abstractAn offset compensation technique for a latch type sense amplifier is proposed in this paper. The proposed scheme is based on the recalibration of the charging/discharging current of the critical nodes which are affected by the device mismatches. The circuit has been designed in a 65 nm CMOS technology with 1.2 V core transistors. The auto-calibration procedure is fully digital. Simulation results are given verifying the operation for sampling a 5 Gb/s signal dissipating only 360 uW.en
dc.formattextcs
dc.format.extent1121-1129cs
dc.format.mimetypeapplication/pdfen
dc.language.isoencs
dc.publisherSpolečnost pro radioelektronické inženýrstvícs
dc.relation.ispartofRadioengineeringcs
dc.relation.urihttp://www.radioeng.cz/fulltexts/2014/14_04_1121_1129.pdfcs
dc.rightsCreative Commons Attribution 3.0 Unported Licenseen
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/en
dc.subjectOffset cancelationen
dc.subjectSense amplifiersen
dc.subjectClocked comparatorsen
dc.subjectLatch circuits.en
dc.titleAn Offset Cancelation Technique for Latch Type Sense Amplifiersen
eprints.affiliatedInstitution.facultyFakulta eletrotechniky a komunikačních technologiícs
dc.coverage.issue4cs
dc.coverage.volume23cs
dc.rights.accessopenAccessen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen


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