Reliable Modeling of Ideal Generic Memristors via State-Space Transformation

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Date
2015-06
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Mark
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Společnost pro radioelektronické inženýrství
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Abstract
The paper refers to problems of modeling and computer simulation of generic memristors caused by the so-called window functions, namely the stick effect, nonconvergence, and finding fundamentally incorrect solutions. A profoundly different modeling approach is proposed, which is mathematically equivalent to window-based modeling. However, due to its numerical stability, it definitely smoothes the above problems away.
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Citation
Radioengineering. 2015 vol. 24, č. 2, s. 393-407. ISSN 1210-2512
http://www.radioeng.cz/fulltexts/2015/15_02_0393_0407.pdf
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Peer-reviewed
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en
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Creative Commons Attribution 3.0 Unported License
http://creativecommons.org/licenses/by/3.0/
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