Browsing Ústav fyziky by Author "Klapetek, Petr"
Now showing items 1-1 of 1
-
Methods for topography artifacts compensation in scanning thermal microscopy
Martinek, Jan; Klapetek, Petr; Charvátová Campbell, Anna (Elsevier, 2015-08-01)Thermal conductivity contrast images in scanning thermal microscopy (SThM) are often distorted by artifacts related to local sample topography. Three methods for numerically estimating and compensating for topographic ...