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  • Methods for topography artifacts compensation in scanning thermal microscopy 

    Martinek, Jan; Klapetek, Petr; Charvátová Campbell, Anna (Elsevier, 2015-08-01)
    Thermal conductivity contrast images in scanning thermal microscopy (SThM) are often distorted by artifacts related to local sample topography. Three methods for numerically estimating and compensating for topographic ...