Now showing items 1-2 of 2

  • Methods for topography artifacts compensation in scanning thermal microscopy 

    Martinek, Jan; Klapetek, Petr; Charvátová Campbell, Anna (Elsevier, 2015-08-01)
    Thermal conductivity contrast images in scanning thermal microscopy (SThM) are often distorted by artifacts related to local sample topography. Three methods for numerically estimating and compensating for topographic ...
  • Nonlinear Elastic Wave Spectroscopy with MLS Perturbation Signal 

    Carbol, Ladislav; Martinek, Jan; Kusák, Ivo; Kucharczyková, Barbara (Výzkumný ústav stavebních hmot,a.s., 2016-05-31)
    The article describes a test procedure based on the fundamental principle of Nonlinear Elastic Wave Spectroscopy. Without integration of all test stages into one automated measurement station and without Maximum Length ...