Browsing Ústav fyziky by Author "Vaněk, Jiří"

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Low-frequency noise measurements used for quality assessment of GaSb based laser diodes prepared by molecular beam epitaxy

Chobola, Zdeněk; Luňák, Miroslav; Vaněk, Jiří; Hulicius, Eduard; Kusák, Ivo (Faculty of Electrical Engineering and Information Technology of the Slovak University of Technology, 2015-08-01)

The paper reports on a non-destructive method of reliability prediction for semiconductor lasers diodes GaSb based VCSE. Transport and noise characteristic of forward biased were measured in order to evaluate the new MBE ...