Using the Microscope for Diagnostics of Structure of Materials and Fault El. Equipment
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Date
2015
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Mark
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Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract
The goal of this thesis is to describe the possibility of using a microscope for documentation of defects and innovation of electrical machines. I used an electron microscope to document carbon brushes and nanomaterials for possible upgrade of the sliding contact. Used microscopes gives us detailed information about the structure of materials at locations with the largest stress in the electrical machine. Collected data can be further analyzed and and carbon brushes can be innovated according to the results.
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Proceedings of the 21st Conference STUDENT EEICT 2015. s. 296-299. ISBN 978-80-214-5148-3
http://www.feec.vutbr.cz/EEICT/
http://www.feec.vutbr.cz/EEICT/
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cs
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© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií