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Current Fluctuations of Reverse-Biased Solar

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eeict2015-546-skvarenina.pdf (3.980Mb)
Date
2015
Author
Škvarenina, Ľ.
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Abstract
This paper presents mainly noise diagnostics of pn junctions local defects in a singlecrystalline silicon solar cells structure. Research consists of a non-destructive measurement methodology of reverse-biased junction in solar cells. Diagnostics of defect areas in this documents are based especially on measurement of noise power spectral density, measurement of the radiation emitted from defects in visible range and I-V characteristic measurement.
Keywords
Solar Cells, Silicon, Noise Spectroscopy, Diagnostics, Defects, Flicker Noise
Persistent identifier
http://hdl.handle.net/11012/43060
Document type
Peer reviewed
Document version
Final PDF
Source
Proceedings of the 21st Conference STUDENT EEICT 2015. s. 546-550. ISBN 978-80-214-5148-3
http://www.feec.vutbr.cz/EEICT/
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  • Student EEICT 2015 [169]
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