Now showing items 1-1 of 1

  • Assembly Influence on the Small-Signal Parameters of a Packaged Transistor 

    Sokol, V.; Cerny, P.; Hoffmann, K.; Skvor, Z. (Společnost pro radioelektronické inženýrství, 2005-12)
    A detailed analysis of the assembly influence on the small-signal parameters of a packaged transistor is presented. A new method, based on 3D field simulation and mixed-mode scattering parameters approach is proposed. ...