Now showing items 1-3 of 3
Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state
(Optical Society of America, 2017-07-05)
Scanning near-field optical microscopy (SNOM) in combination with interference structures is a powerful tool for imaging and analysis of surface plasmon polaritons (SPPs). However, the correct interpretation of SNOM images ...
Research Update: Focused ion beam direct writing of magnetic patterns with controlled structural and magnetic properties
(AIP Publishing, 2018-06-01)
Focused ion beam irradiation of metastable Fe78Ni22 thin films grown on Cu(100) substrates is used to create ferromagnetic, body-centered cubic patterns embedded into paramagnetic, face-centered-cubic surrounding. The ...
The growth of metastable fcc Fe78Ni22 thin films on H-Si(100) substrates suitable for focused ion beam direct magnetic patterning
We have studied the growth of metastable face-centered-cubic, non-magnetic Fe78Ni22 thin films on silicon substrates. These films undergo a magnetic (paramagnetic to ferromagnetic) and structural (fcc to bcc) phase ...