Fractal Analysis of the 3-D surface Topography of GaAs Solar Cells
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Date
2018-02-11
ORCID
Advisor
Referee
Mark
Journal Title
Journal ISSN
Volume Title
Publisher
DEStech Publications, Inc.
Abstract
This article is devoted to study of Atomic Force Microscopy (AFM) images of solar cells
based on gallium arsenide (GaAs). Mathematical processing of data involves obtaining additional
information about topography. The analysis was carried out using AFM data for GaAs solar cells,
before and after temperature treatment. The state of the surface affects the reflectivity, so the
structuring of the surface is of particular interest. Optimized textures are needed to improve the
optical properties of surfaces. Fractal analysis allows quantifying the condition of the morphology
of the surface on the basis of AFM data.
Tento článek je věnován studiu AFM obrazů solárních článků na bázi arsenidu gallia (GaAs).
Tento článek je věnován studiu AFM obrazů solárních článků na bázi arsenidu gallia (GaAs).
Description
Citation
DEStech Transactions on Environment, Energy and Earth Sciences. 2018, p. 489-493.
http://dpi-proceedings.com/index.php/dteees/article/view/18173
http://dpi-proceedings.com/index.php/dteees/article/view/18173
Document type
Peer-reviewed
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Published version
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Language of document
en
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Date of acceptance
Defence
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(C) DEStech Publications, Inc.