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dc.contributor.authorRebelli, S.
dc.contributor.authorNistala, B. R.
dc.date.accessioned2018-06-18T12:49:19Z
dc.date.available2018-06-18T12:49:19Z
dc.date.issued2018-06cs
dc.identifier.citationRadioengineering. 2018 vol. 27, č. 2, s. 532-540. ISSN 1210-2512cs
dc.identifier.issn1210-2512
dc.identifier.urihttp://hdl.handle.net/11012/83037
dc.description.abstractThis paper presents an efficient wavelet based numerical method for analyzing functional and dynamic crosstalk of CMOS driven coupled copper (Cu) interconnects known as Multi-Resolution Time Domain (MRTD),wherein, the CMOS drivers are modeled using nth-power law model. The performance of the proposed MRTD method is evaluated through recursive simulations in HSPICE environment and compared with the conventional Finite Difference Time Domain (FDTD) method at 32-nm technology node for global interconnects of length 1mm, where the computations of the proposed model and conventional FDTD are carried out using MATLAB. For different number of test cases, the proposed MRTD method gives an average error of 0.14 % and 1.9 % for peak crosstalk noise and peak noise timing, respectively, with respect to HSPICE results. Also, the dynamic crosstalk noise on victim line of the proposed MRTD method are in close agreement with those of HSPICE. The results show the dominance of the proposed MRTD method over the conventional FDT method regarding accuracy. The proposed MRTD method is also extended for three-mutuallycoupled interconnect lines for crosstalk analysis, with an average error less than 1 % when compared to that of more than 3 % using the conventional FDTD method. Moreover, for the transient analysis, the MRTD method is more time efficient than HSPICE.en
dc.formattextcs
dc.format.extent532-540cs
dc.format.mimetypeapplication/pdfen
dc.language.isoencs
dc.publisherSpolečnost pro radioelektronické inženýrstvícs
dc.relation.ispartofRadioengineeringcs
dc.relation.urihttps://www.radioeng.cz/fulltexts/2018/18_02_0532_0540.pdfcs
dc.rightsCreative Commons Attribution 4.0 Internationalen
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en
dc.subjectCMOS Driveren
dc.subjectCu interconnectsen
dc.subjectpeak crosstalk noiseen
dc.subjectdelayen
dc.subjectMRTDen
dc.subjectFDTDen
dc.subjectHSPICEen
dc.titleAn Efficient MRTD Model for the Analysis of Crosstalk in CMOS-Driven Coupled Cu Interconnectsen
eprints.affiliatedInstitution.facultyFakulta eletrotechniky a komunikačních technologiícs
dc.coverage.issue2cs
dc.coverage.volume27cs
dc.identifier.doi10.13164/re.2018.0532en
dc.rights.accessopenAccessen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen


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Creative Commons Attribution 4.0 International
Except where otherwise noted, this item's license is described as Creative Commons Attribution 4.0 International