Browsing Student EEICT 2016 by Subject "Defect"
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(Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií, 2016)This paper deals with detecting of defects on BGA (Ball Grid Array) components using X-ray. Defects are formed throw reflow process of BGA components during assembly, but also later due to mechanical and thermal stress. ...