| dc.contributor.author | Vaněk, Stanislav | |
| dc.date.accessioned | 2018-07-10T12:48:12Z | |
| dc.date.available | 2018-07-10T12:48:12Z | |
| dc.date.issued | 2016 | cs |
| dc.identifier.citation | Proceedings of the 22nd Conference STUDENT EEICT 2016. s. 121-123. ISBN 978-80-214-5350-0 | cs |
| dc.identifier.isbn | 978-80-214-5350-0 | |
| dc.identifier.uri | http://hdl.handle.net/11012/83892 | |
| dc.description.abstract | The internet of things leads to a massive interest in security of embedded devices. Nowadays, power analysis poses extremely effective and successful types of attacks to break confidential cryptographic algorithms such as AES (Advanced Encryption Standard), RSA (Rivest Shamir Adleman) and cryptographic devices such as smart cards. This paper deals with the method of localization of interesting markers in power analysis called NICV (Normalized Inter-Class Variance). The aim of the paper is to describe this method and its implementation. | en |
| dc.format | text | cs |
| dc.format.extent | 121-123 | cs |
| dc.format.mimetype | application/pdf | en |
| dc.language.iso | cs | cs |
| dc.publisher | Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
| dc.relation.ispartof | Proceedings of the 22nd Conference STUDENT EEICT 2016 | en |
| dc.relation.uri | http://www.feec.vutbr.cz/EEICT/ | cs |
| dc.rights | © Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
| dc.subject | NICV | en |
| dc.subject | DPA | en |
| dc.subject | CPA | en |
| dc.subject | variance | en |
| dc.title | Normalized Inter-class Variance (NICV) | en |
| eprints.affiliatedInstitution.department | Fakulta elektrotechniky a komunikačních technologií | cs |
| but.event.date | 28.04.2016 | cs |
| but.event.title | Student EEICT 2016 | cs |
| dc.rights.access | openAccess | en |
| dc.type.driver | conferenceObject | en |
| dc.type.status | Peer-reviewed | en |
| dc.type.version | publishedVersion | en |
