• čeština
    • English
    • русский
    • Deutsch
    • français
    • polski
    • українська
  • English 
    • čeština
    • English
    • русский
    • Deutsch
    • français
    • polski
    • українська
  • Login
View Item 
  •   Repository Home
  • Publikační činnost pracovníků VUT v Brně
  • Fakulta strojního inženýrství
  • Ústav fyzikálního inženýrství
  • View Item
  •   Repository Home
  • Publikační činnost pracovníků VUT v Brně
  • Fakulta strojního inženýrství
  • Ústav fyzikálního inženýrství
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state

Zobrazování interferenčních obrazců v blízkém poli pomocí a-SNOM – vliv vlnové délky a polarizace osvitu

Thumbnail
View/Open
Imagingofnearfieldvut.pdf (22.29Mb)
Date
2017-07-05
Author
Dvořák, Petr
Édes, Zoltán
Kvapil, Michal
Šamořil, Tomáš
Ligmajer, Filip
Hrtoň, Martin
Kalousek, Radek
Křápek, Vlastimil
Dub, Petr
Spousta, Jiří
Varga, Peter
Šikola, Tomáš
Altmetrics
10.1364/OE.25.016560
Metadata
Show full item record
Abstract
Scanning near-field optical microscopy (SNOM) in combination with interference structures is a powerful tool for imaging and analysis of surface plasmon polaritons (SPPs). However, the correct interpretation of SNOM images requires profound understanding of principles behind their formation. To study fundamental principles of SNOM imaging in detail, we performed spectroscopic measurements by an aperture-type SNOM setup equipped with a supercontinuum laser and a polarizer, which gave us all the degrees of freedom necessary for our investigation. The series of wavelength- and polarization-resolved measurements, together with results of numerical simulations, then allowed us to identify the role of individual near-field components in formation of SNOM images, and to show that the out-of-plane component generally dominates within a broad range of parameters explored in our study. Our results challenge the widespread notion that this component does not couple to the a-SNOM probe and indicate that the issue of SNOM probe sensitivity towards the in-plane and out-of-plane near-field components – one of the most challenging tasks of near field interference SNOM measurements – is not yet fully resolved.
 
Článek se zabývá vlivem jednotlivých komponent blízkého pole na tvar interferenčních obrazců měřených pomocí rastrovací optické mikroskopie v blízkém poli.
 
Keywords
plasmonics, components, spectroscopy, interferometric imaging, plazmonika, složky, spektroskopie, interferometrické zobrazování
Persistent identifier
http://hdl.handle.net/11012/84174
Document type
Peer reviewed
Document version
Final PDF
Source
OPTICS EXPRESS. 2017, vol. 25, issue 14, p. 16560-16573.
https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-25-14-16560&id=369005
DOI
10.1364/OE.25.016560
Collections
  • Příprava a charakterizace nanostruktur [53]
  • Ústav fyzikálního inženýrství [103]
Citace PRO

Portal of libraries | Central library on Facebook
DSpace software copyright © 2002-2015  DuraSpace
Contact Us | Send Feedback | Theme by @mire NV
 

 

Browse

All of repositoryCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

My Account

LoginRegister

Statistics

View Usage Statistics

Portal of libraries | Central library on Facebook
DSpace software copyright © 2002-2015  DuraSpace
Contact Us | Send Feedback | Theme by @mire NV