An Automated ESD Model Characterization Method
Alternative metrics PlumXhttp://hdl.handle.net/11012/137037
MetadataShow full item record
Novel automated simulator-independent ESD model characterization method based on Differential evolution and Nelder-Mead Simplex algorithms is presented in this paper. It offers an alternative for time and human-resources demanding manual characterization that is still widely used. The paper also presents stable models of the four most often used snapback-based protection devices in CMOS technologies, i.e., NMOST and three variants of silicon-controlled rectifier structure. These models were used for evaluation of the proposed method and the results are included and discussed.
Document typePeer reviewed
SourceRadioengineering. 2018 vol. 27, č. 3, s. 784-795. ISSN 1210-2512
- 2018/3