An Automated ESD Model Characterization Method
Alternativní metriky PlumXhttp://hdl.handle.net/11012/137037
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Novel automated simulator-independent ESD model characterization method based on Differential evolution and Nelder-Mead Simplex algorithms is presented in this paper. It offers an alternative for time and human-resources demanding manual characterization that is still widely used. The paper also presents stable models of the four most often used snapback-based protection devices in CMOS technologies, i.e., NMOST and three variants of silicon-controlled rectifier structure. These models were used for evaluation of the proposed method and the results are included and discussed.
Typ dokumentuRecenzovaný dokument
Zdrojový dokumentRadioengineering. 2018 vol. 27, č. 3, s. 784-795. ISSN 1210-2512
- 2018/3