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dc.contributor.authorPokorny, Josef
dc.date.accessioned2019-03-04T10:05:56Z
dc.date.available2019-03-04T10:05:56Z
dc.date.issued2018cs
dc.identifier.citationProceedings of the 24th Conference STUDENT EEICT 2018. s. 493-497. ISBN 978-80-214-5614-3cs
dc.identifier.isbn978-80-214-5614-3
dc.identifier.urihttp://hdl.handle.net/11012/138283
dc.description.abstractThis article deals with comparing of data in the main world spectroscopic databases NIST and Kurucz. Our target was to calculate differences in the ratio of Stark broadening and function F which depends on electron density, temperature and pressure. Stark broadening is one of pressure broadenings of spectral lines which arise from the collisions of the emitters with neighboring particles. Stark broadening is due to charged perturbers. We developed the program NKrov for the comparison of databases with the help of regular expressions and the program awk. There were some differences found in input data for the silicon between NIST and Kurucz databases. Our results can be used in further research on silicon spectral lines.en
dc.formattextcs
dc.format.extent493-497cs
dc.format.mimetypeapplication/pdfen
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings of the 24th Conference STUDENT EEICT 2018en
dc.relation.urihttp://www.feec.vutbr.cz/EEICT/cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.subjectStark broadeningen
dc.subjectNIST databaseen
dc.subjectKurucz databaseen
dc.subjectunit systemen
dc.subjectregular expressionsen
dc.titleComparing Main Spectroscopic Daen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
but.event.date26.04.2018cs
but.event.titleStudent EEICT 2018cs
dc.rights.accessopenAccessen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionPublishers's versionen


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