Usage Of Low Cost Digital Camera For Detecting Of Silicon Solar Cell Electroluminiscence
MetadataShow full item record
This article analyses the existing methods both practically and theoretically used to detect defected surface area in solar cells. Various methods were used but by using an upgraded camera with CMOS sensor for carrying out the electroluminescence method, this has proven to have a very crucial impact on the results. Given the overall results and the acquired information, a procedure with a simple parameter can be setup to carry out the measurements. In addition to this a catalog was formed showing the defects occurring in mono and polycrystalline solar cells.
KeywordsCMOS camera, defect detection, diagnostic methods, electroluminescence, photovoltaics, photovoltaic cell, solar cell, silicon
Document typePeer reviewed
Document versionxmlui.vut.verze.Publishers's version
SourceProceedings of the 24th Conference STUDENT EEICT 2018. s. 574-578. ISBN 978-80-214-5614-3
- Student EEICT 2018