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dc.contributor.authorŠedivý, Matúš
dc.date.accessioned2019-03-04T10:06:00Z
dc.date.available2019-03-04T10:06:00Z
dc.date.issued2018cs
dc.identifier.citationProceedings of the 24st Conference STUDENT EEICT 2018. s. 579-583. ISBN 978-80-214-5614-3cs
dc.identifier.isbn978-80-214-5614-3
dc.identifier.urihttp://hdl.handle.net/11012/138300
dc.description.abstractMany vacuum instruments used in industry and scientific research apply high voltage components. Vacuum performs as an insulator with theoretically infinite breakdown voltage. Surface of dielectrics between two electrodes inside a vacuum chamber is the weakest link for a possible electrical breakdown (tracking). This paper focuses on examination of a vacuum pressure influence to the surface breakdown voltage of a various materials. Results were compared and led to determination of an appropriate materials for a design of internal connectors in electron microscopes produced by the company Thermo Fisher Scientific.en
dc.formattextcs
dc.format.extent579-583cs
dc.format.mimetypeapplication/pdfen
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings of the 22st Conference STUDENT EEICT 2016en
dc.relation.urihttp://www.feec.vutbr.cz/EEICT/cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.subjecthigh-voltageen
dc.subjectbreakdownen
dc.subjecttrackingen
dc.subjectdielectricen
dc.subjectglassen
dc.subjectKaptonen
dc.subjectaluminaen
dc.subjectPVDFen
dc.subjectPEEKen
dc.titleTracking Resistance Of Various Materials In Vacuumen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
but.event.date26.04.2018cs
but.event.titleStudent EEICT 2018cs
dc.rights.accessopenAccessen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionPublishers's versionen


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