A Numerical Characterization of the Nanoparticles Distribution on the Surface of a Semiconductor
MetadataShow full item record
The motivation for this work was to qualitatively describe the distribution of Au nanoparticles on the surface of a semiconductor. We discuss suitable mathematical characteristics which allow the uniform distribution to be distinguished from the distribution a ected by any physical phenomenon, i.e. by the repulsive force between electrically charged particles or by the influence of properties of the surface. We identify Voronoi decomposition and a statistical analysis of Voronoi cell properties as a suitable tool for this purpose.
Keywordsdistribution, Voronoi diagram, hypothesis testing, Legendre ellipse, 4PL function, nanoparticles
Document typePeer reviewed
Document versionFinal PDF
SourceMendel. 2017 vol. 23, č. 1, s. 125-132. ISSN 1803-3814
- Vol. 23, No. 1