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Spectrum Analysis Of Damaged Led Light Sources

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Date
2019
Author
Janík, Daniel
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Abstract
Permanent damage to LED chips, often high temperature is one of the common problems. The article compares the spectrum of LED retrofits before and after permanent high temperature damage. Several different samples tested were damaged by the same defined temperature during operation. The radiated spectrum was measured before and after exposure to the temperature and subsequently evaluated.
Keywords
LED light sources, LED retrofit, permanent damage
Persistent identifier
http://hdl.handle.net/11012/186762
Document type
Peer reviewed
Document version
xmlui.vut.verze.Publishers's version
Source
Proceedings of the 25st Conference STUDENT EEICT 2019. s. 699-702. ISBN 978-80-214-5735-5
http://www.feec.vutbr.cz/EEICT/
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  • Student EEICT 2019 [174]
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