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dc.contributor.authorLukáš, Vykydal
dc.date.accessioned2020-05-07T09:40:28Z
dc.date.available2020-05-07T09:40:28Z
dc.date.issued2017cs
dc.identifier.citationProceedings of the 23st Conference STUDENT EEICT 2017. s. 236-238. ISBN 978-80-214-5496-5cs
dc.identifier.isbn978-80-214-5496-5
dc.identifier.urihttp://hdl.handle.net/11012/187093
dc.description.abstractThis paper deals with memory testing principles, focusing mainly on March algorithms. It describes their usage on word based memories. In second part it proposes small programmable BIST controller that can be used in digital circuits.en
dc.formattextcs
dc.format.extent236-238cs
dc.format.mimetypeapplication/pdfen
dc.language.isocscs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings of the 23st Conference STUDENT EEICT 2017en
dc.relation.urihttp://www.feec.vutbr.cz/EEICT/cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.subjectmemory testingen
dc.subjectMarch algorithmsen
dc.subjectmemory BISTen
dc.subjectcountersen
dc.titleMicrocode-Controlled Ram Bisten
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
but.event.date27.04.2017cs
but.event.titleStudent EEICT 2017cs
dc.rights.accessopenAccessen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionPublishers's versionen


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