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  • Atomic force microscopy analysis of nanoparticles in non-ideal conditions 

    Klapetek, Petr; Valtr, Miroslav; Nečas, David; Salyk, Ota; Dzik, Petr (Springer Open, 2011-08-30)
    Nanoparticles are often measured using atomic force microscopy or other scanning probe microscopy methods. For isolated nanoparticles on flat substrates, this is a relatively easy task. However, in real situations, we often ...