Digital Offset Calibration of an OPAMP Towards Improving Static Parameters of 90 nm CMOS DAC
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In this paper, an on-chip self-calibrated 8-bit R-2R digital-to-analog converter (DAC) based on digitally compensated input offset of the operational amplifier (OPAMP) is presented. To improve the overall DAC performance, a digital offset cancellation method was used to compensate deviations in the input offset voltage of the OPAMP caused by process variations. The whole DAC as well as offset compensation circuitry were designed in a standard 90 nm CMOS process. The achieved results show that after the self-calibration process, the improvement of 48% in the value of DAC offset error is achieved.
Document typePeer reviewed
Document versionFinal PDF
SourceRadioengineering. 2014, vol. 23, č. 3, s. 931-938. ISSN 1210-2512
- 2014/3