An Offset Cancelation Technique for Latch Type Sense Amplifiers
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An offset compensation technique for a latch type sense amplifier is proposed in this paper. The proposed scheme is based on the recalibration of the charging/discharging current of the critical nodes which are affected by the device mismatches. The circuit has been designed in a 65 nm CMOS technology with 1.2 V core transistors. The auto-calibration procedure is fully digital. Simulation results are given verifying the operation for sampling a 5 Gb/s signal dissipating only 360 uW.
Document typePeer reviewed
Document versionFinal PDF
SourceRadioengineering. 2014, vol. 23, č. 4, s. 1121-1129. ISSN 1210-2512
- 2014/4