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Using the Microscope for Diagnostics of Structure of Materials and Fault El. Equipment

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eeict2015-296-cvak.pdf (1.066Mb)
Date
2015
Author
Cvak, J.
Alternative metrics PlumX
http://hdl.handle.net/11012/43006
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http://hdl.handle.net/11012/43006
http://hdl.handle.net/11012/43006
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Abstract
The goal of this thesis is to describe the possibility of using a microscope for documentation of defects and innovation of electrical machines. I used an electron microscope to document carbon brushes and nanomaterials for possible upgrade of the sliding contact. Used microscopes gives us detailed information about the structure of materials at locations with the largest stress in the electrical machine. Collected data can be further analyzed and and carbon brushes can be innovated according to the results.
Keywords
nanomaterials, innovation, material structure, diagnostic methods, sliding contact
Persistent identifier
http://hdl.handle.net/11012/43006
Document type
Peer reviewed
Document version
Final PDF
Source
Proceedings of the 21st Conference STUDENT EEICT 2015. s. 296-299. ISBN 978-80-214-5148-3
http://www.feec.vutbr.cz/EEICT/
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  • Student EEICT 2015 [169]
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