Show simple item record

dc.contributor.authorCvak, J.
dc.date.accessioned2015-08-25T08:43:00Z
dc.date.available2015-08-25T08:43:00Z
dc.date.issued2015cs
dc.identifier.citationProceedings of the 21st Conference STUDENT EEICT 2015. s. 296-299. ISBN 978-80-214-5148-3cs
dc.identifier.isbn978-80-214-5148-3
dc.identifier.urihttp://hdl.handle.net/11012/43006
dc.description.abstractThe goal of this thesis is to describe the possibility of using a microscope for documentation of defects and innovation of electrical machines. I used an electron microscope to document carbon brushes and nanomaterials for possible upgrade of the sliding contact. Used microscopes gives us detailed information about the structure of materials at locations with the largest stress in the electrical machine. Collected data can be further analyzed and and carbon brushes can be innovated according to the results.en
dc.formattextcs
dc.format.extent296-299cs
dc.format.mimetypeapplication/pdfen
dc.language.isocscs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings of the 21st Conference STUDENT EEICT 2015en
dc.relation.urihttp://www.feec.vutbr.cz/EEICT/cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.subjectnanomaterialsen
dc.subjectinnovationen
dc.subjectmaterial structureen
dc.subjectdiagnostic methodsen
dc.subjectsliding contacten
dc.titleUsing the Microscope for Diagnostics of Structure of Materials and Fault El. Equipmenten
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
but.event.date23.04.2015cs
but.event.titleStudent EEICT 2015cs
dc.rights.accessopenAccessen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record