Current Fluctuations of Reverse-Biased Solar
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This paper presents mainly noise diagnostics of pn junctions local defects in a singlecrystalline silicon solar cells structure. Research consists of a non-destructive measurement methodology of reverse-biased junction in solar cells. Diagnostics of defect areas in this documents are based especially on measurement of noise power spectral density, measurement of the radiation emitted from defects in visible range and I-V characteristic measurement.
Document typePeer reviewed
Document versionFinal PDF
SourceProceedings of the 21st Conference STUDENT EEICT 2015. s. 546-550. ISBN 978-80-214-5148-3
- Student EEICT 2015