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  • Microwave Impedance Measurement for Nanoelectronics 

    Randus, M.; Hoffmann, K. (Společnost pro radioelektronické inženýrství, 2011-04)
    The rapid progress in nanoelectronics showed an urgent need for microwave measurement of impedances extremely different from the 50Ω reference impedance of measurement instruments. In commonly used methods input impedance ...