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dc.contributor.authorKucera, O.
dc.date.accessioned2016-03-11T09:17:15Z
dc.date.available2016-03-11T09:17:15Z
dc.date.issued2010-04cs
dc.identifier.citationRadioengineering. 2010, vol. 19, č. 1, s. 168-171. ISSN 1210-2512cs
dc.identifier.issn1210-2512
dc.identifier.urihttp://hdl.handle.net/11012/56979
dc.description.abstractSeveral applications of the atomic force microscopy (AFM), such as measurement of soft samples, manipulation with molecules, etc., require mechanical analysis of the AFM probe behavior. In this article we suggest the electrical circuit analogy to AFM cantilever tip motion. Well developed circuit theories in connection with fairly accessible software for circuit analysis make this alternative method easy to use for a wide community of AFM users.en
dc.formattextcs
dc.format.extent168-171cs
dc.format.mimetypeapplication/pdfen
dc.language.isoencs
dc.publisherSpolečnost pro radioelektronické inženýrstvícs
dc.relation.ispartofRadioengineeringcs
dc.relation.urihttp://www.radioeng.cz/fulltexts/2010/10_01_168_171.pdfcs
dc.rightsCreative Commons Attribution 3.0 Unported Licenseen
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/en
dc.subjectAtomic Force Microscopyen
dc.subjectelectrical mechanical analogsen
dc.subjectcircuit theoryen
dc.titleElectrical Analogy to an Atomic Force Microscopeen
eprints.affiliatedInstitution.facultyFakulta eletrotechniky a komunikačních technologiícs
dc.coverage.issue1cs
dc.coverage.volume19cs
dc.rights.accessopenAccessen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen


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