Now showing items 5-8 of 8

  • The LFSR and BCA VHDL Models for Built-in Self-test Circuits 

    Mitrych, J. (Společnost pro radioelektronické inženýrství, 2002-04)
    The various test structures are proposed for BIST techniques [1], [2]. A typical structure used for generation of pseudo-random test sets is the linear feedback shift register (LFSR). The BIST techniques have wide application ...
  • New Predicted Spiral Search Block Matching Algorithm - PSSBMA 

    Pika, J. (Společnost pro radioelektronické inženýrství, 2002-04)
    This article describes the modification of the full search algorithm ESBMA (Exhaustive Search Block Matching Algorithm), which leads up to 40% speed increase. The modification is based on the ESBMA motion field analysis ...
  • Performance of Basic Vector Directional Filters According to Used Angle Distance 

    Lukac, R. (Společnost pro radioelektronické inženýrství, 2002-04)
    Color images are typical examples of vector-valued signals. For that reason, vector processing represents an optimal approach. Although widely used vector filter is a vector median based on a reduced ordering, the directional ...
  • VHDL Models with Usage of the LFSR_PCKG Package 

    Kovalsky, J.; Vlcek, K.; Mitrych, J. (Společnost pro radioelektronické inženýrství, 2002-04)
    LFSRs (Linear Feedback Shift Registers) are very often used in the BIST (Built-In Self-Test) methodology. Implementation of the LFSRs to the design or application of digital system, which supports BIST techniques or which ...