• Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state 

    Dvořák, Petr; Édes, Zoltán; Kvapil, Michal; Šamořil, Tomáš; Ligmajer, Filip; Hrtoň, Martin; Kalousek, Radek; Křápek, Vlastimil; Dub, Petr; Spousta, Jiří; Varga, Peter; Šikola, Tomáš (Optical Society of America, 2017-07-05)
    Scanning near-field optical microscopy (SNOM) in combination with interference structures is a powerful tool for imaging and analysis of surface plasmon polaritons (SPPs). However, the correct interpretation of SNOM images ...