An Automated ESD Model Characterization Method
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Date
2018-09
Authors
ORCID
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Referee
Mark
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Volume Title
Publisher
Společnost pro radioelektronické inženýrství
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Abstract
Novel automated simulator-independent ESD model characterization method based on Differential evolution and Nelder-Mead Simplex algorithms is presented in this paper. It offers an alternative for time and human-resources demanding manual characterization that is still widely used. The paper also presents stable models of the four most often used snapback-based protection devices in CMOS technologies, i.e., NMOST and three variants of silicon-controlled rectifier structure. These models were used for evaluation of the proposed method and the results are included and discussed.
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Citation
Radioengineering. 2018 vol. 27, č. 3, s. 784-795. ISSN 1210-2512
https://www.radioeng.cz/fulltexts/2018/18_03_0784_0795.pdf
https://www.radioeng.cz/fulltexts/2018/18_03_0784_0795.pdf
Document type
Peer-reviewed
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en