Spectrum Analysis Of Damaged Led Light Sources
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Date
2019
Authors
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Referee
Mark
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Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract
Permanent damage to LED chips, often high temperature is one of the common problems. The article compares the spectrum of LED retrofits before and after permanent high temperature damage. Several different samples tested were damaged by the same defined temperature during operation. The radiated spectrum was measured before and after exposure to the temperature and subsequently evaluated.
Description
Citation
Proceedings of the 25st Conference STUDENT EEICT 2019. s. 699-702. ISBN 978-80-214-5735-5
http://www.feec.vutbr.cz/EEICT/
http://www.feec.vutbr.cz/EEICT/
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Peer-reviewed
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en
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© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií