Electrical Analogy to an Atomic Force Microscope
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Date
2010-04
Authors
ORCID
Advisor
Referee
Mark
Journal Title
Journal ISSN
Volume Title
Publisher
Společnost pro radioelektronické inženýrství
Abstract
Several applications of the atomic force microscopy (AFM), such as measurement of soft samples, manipulation with molecules, etc., require mechanical analysis of the AFM probe behavior. In this article we suggest the electrical circuit analogy to AFM cantilever tip motion. Well developed circuit theories in connection with fairly accessible software for circuit analysis make this alternative method easy to use for a wide community of AFM users.
Description
Citation
Radioengineering. 2010, vol. 19, č. 1, s. 168-171. ISSN 1210-2512
http://www.radioeng.cz/fulltexts/2010/10_01_168_171.pdf
http://www.radioeng.cz/fulltexts/2010/10_01_168_171.pdf
Document type
Peer-reviewed
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Published version
Date of access to the full text
Language of document
en