The LFSR and BCA VHDL Models for Built-in Self-test Circuits

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02_01_14_17.pdf(306.98 KB)
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2002-04
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Mark
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Společnost pro radioelektronické inženýrství
Abstract
The various test structures are proposed for BIST techniques [1], [2]. A typical structure used for generation of pseudo-random test sets is the linear feedback shift register (LFSR). The BIST techniques have wide application in testing whole devices and embedded components. We focus on the analysis of the state coverage, fault coverage, and optimal structure of BIST schemes.
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Linear feedback shift register (LFSR), cellular auto-mata (CA), middle grain FPGA structure, VHDL modelling, BIST structure optimal implementation
Citation
Radioengineering. 2002, vol. 11, č. 1, s. 14-17. ISSN 1210-2512
http://www.radioeng.cz/fulltexts/2002/02_01_14_17.pdf
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Peer-reviewed
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en
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Creative Commons Attribution 3.0 Unported License
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http://hdl.handle.net/11012/58136
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2002/1
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